Nanostructured Materials Microscopy Group
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19TH INTERNATIONAL CONFERENCE ON EXTENDED DEFECTS IN SEMICONDUCTORS, EDS2018

Saturday 13 January 2018

CALL FOR PAPERS

The EDS 2018 will be held on JUNE 24-29, 2018, at the Porto Palace Hotel in THESSALONIKI, GREECE.

ABSTRACT DEADLINE: March 11, 2018

Scheduled Topics:

  • Materials Science fundamentals
  • Material types (e.g. Poly-, Micro- and Nanocrystalline group-IV semiconductors, III-V and II-VI compound semiconductors and alloys, III-nitrides and alloys, 2D layered semiconductors, Carbon-based semiconductors, Magnetic semiconductor, Conducting oxides, Thermoelectric semiconductors etc.)
  • Applications and device technology addressing the role of extended defects in limiting device performance
  • New developments in methodologies and tools for defect engineering in semiconducting materials
  • Advanced characterization techniques and methods, in-situ imaging and analysis
  • Computational methods and techniques covering length and time scales
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